Leader LV5900A WAVEFORM MONITOR

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Description

The LV5900A waveform monitor supports SMPTE ST 2082-12, which is used to receive 7680(8192)x4320 / 59.94P YCBCR10bit 8K video via 12G-SDI QUAD LINK. As it supports not only 8K but also a 4k input and four simultaneous HD inputs, you can use it as a high-end 8K system and switch between other systems as needed. The waveform, vector, picture, and eye pattern display allows for the measurement and quality control of various video signals. The status display allows you to view various error statuses and check on system stability by viewing event logs and long-term charts.

Features

  • Superb OperabilityThe apparatus is designed to give top priority to operability; and further a 9-inch full HD LCD panel featuring excellent view angle and color reproducibility is employed. This model can also be used as a high-grade HD picture monitor. In addition, a touch-panel external monitor connected through USB interface enables intuitive operations and settings through touch operation.
  • 2K/4K/8K Video FormatsVideo formats support includes SDI signals in various formats ranging from, 8K video format with quad link of 12G-SDI, 4K video format with the single link of 12G-SDI, dual link of 6G-SDI, quad link of 3G-SDI and quad link of HD-SDI, in addition to the single link of HD-SDI and 3G-SDI.
  • Transmission Quality Analysis FunctionThe LV5900A has feature of enhanced ancillary data analysis functions which includes sync measurement, SDI signal frequency deviation measurement, and equivalent cable length measurement.
  • Video Analysis FunctionFor various video signals; quality of experience (QoE) measurement of video signals, such as detection of freeze errors, black errors, gamut errors, in addition to varieties of displays, including the video signal waveform display, vector display, picture display, 5- BAR display and CIE Chromaticity Diagram, are standard features. Errors detected can be recorded as event logs.
  • Audio Analysis FunctionFor audio signals, the level meter display, Lissajous waveform display, surround display (not supported for 8K), and loudness display are possible for SDI signals with embedded audio and MADI audio signals externally entered. The signals can also be muted, and clip error detection is possible. Errors detected can be recorded as event logs.
  • Eye-Pattern DisplayThe eye-pattern display and jitter display are possible for SDI signals covering from HD-SDI to 12G-SDI. For the measured values, automatic measurement is possible in addition to measurement with a cursor. Furthermore, the histogram can be superimposed on the eye-pattern display for display.
  • Subtitle/Closed Caption Decode Display Function (Not supported for 8K)The decode display is possible of Japanese subtitles superimposed onto SDI signals, CEA-608 or CEA-708 closed captions, teletexts, and OP47 subtitles.
  • Input of External Synchronizing Signal with the Waveform Display FunctionPhase differences and synchronization status of all SDI video signals can be checked graphically against external reference synchronizing signal (black burst, tri-level sync signal).
  • Customizable LayoutVarious video signal waveforms, vector display, and pictures of input video signals can be laid out in any of the required positions in the preferred sizes. Multiple input signals up to four inputs can be displayed simultaneously, and one single input signal can be displayed in multiple windows.
  • SDI Signal Generating FunctionSDI signals covering HD-SDI to 12G-SDI are supported, and 4K video format of Quad Link 3G-SDI and 8K video format of Quad Link 12G-SDI are also supported. Patterns can be output in the form of HD multi-format color bar, 4K multi-format color bar, HDR color bar, etc.
  • Monitor output connectorsThe SDI OUTPUT connector and TMDS OUTPUT connector transmit the instrument’s screen to a full high definition (1920×1080) display for monitoring purposes.
  • Capture FeatureA screen capture feature, which captures the entire display as still-image data, is available. Not only captured data can be displayed on the instrument, but it can also be compared with an input signal or saved to a USB memory device as bitmap data for viewing on a PC.A frame capture feature (4K 2-screen display is not supported; only FRM format is supported for 8K) is also available. Frames, including the blanking interval, can be captured. You can set the frame capture function mode to manual or auto, which captures frames when errors occur.The frame capture data can be viewed and searched through on a PC using a frame capture viewer.
  • Time Code DisplayThe timecodes embedded in SDI signals can be displayed. The timecode can also be used as the timestamp in the event log.
  • External Remote ConnectorA contact terminal can be used to load presets, switch the input signal, and transmit alarms.
  • Ethernet PortThe following features become available when you connect the instrument to a PC: remote control through TELNET, file transfer through FTP, remote control and alarm generation through SNMP, remote control from a Web browser through HTTP, and internal clock synchronization through SNTP. Using the LV7290 REMOTE CONTROLLER (sold separately) allows up to eight LV5900As to be remote controlled.
  • HDRLevel monitoring of HDR signals supporting S-Log3, C-Log and Log-C in addition to HLG and PQ that are specified in ITU-R BT.2100, and the level management at assumed luminance (Nits)on the display wherein OOTF is taken into consideration are possible.
  • Focus Assist FunctionDevelopment of a new focus detection algorithm in which the non-linear super resolution technology is applied to sensitively enable focusing of low-contrast images that had been hardly detected.
  • RS-422/485 ConnectorFor serial communication, you can select the Leader’s standard protocol or TSL protocol. When using the Leader’s standard protocol, you can remotely recall presets, switch the display channel, and display the camera ID, iris, and tally by using serial communication.When using the TSL protocol, you can control the camera ID (LABEL-1) and tally(TALLY-1,TALLY-2) displays.

Rear Panel

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Description
Content

The LV5900A waveform monitor supports SMPTE ST 2082-12, which is used to receive 7680(8192)x4320 / 59.94P YCBCR10bit 8K video via 12G-SDI QUAD LINK. As it supports not only 8K but also a 4k input and four simultaneous HD inputs, you can use it as a high-end 8K system and switch between other systems as needed. The waveform, vector, picture, and eye pattern display allows for the measurement and quality control of various video signals. The status display allows you to view various error statuses and check on system stability by viewing event logs and long-term charts.

Features

  • Superb OperabilityThe apparatus is designed to give top priority to operability; and further a 9-inch full HD LCD panel featuring excellent view angle and color reproducibility is employed. This model can also be used as a high-grade HD picture monitor. In addition, a touch-panel external monitor connected through USB interface enables intuitive operations and settings through touch operation.
  • 2K/4K/8K Video FormatsVideo formats support includes SDI signals in various formats ranging from, 8K video format with quad link of 12G-SDI, 4K video format with the single link of 12G-SDI, dual link of 6G-SDI, quad link of 3G-SDI and quad link of HD-SDI, in addition to the single link of HD-SDI and 3G-SDI.
  • Transmission Quality Analysis FunctionThe LV5900A has feature of enhanced ancillary data analysis functions which includes sync measurement, SDI signal frequency deviation measurement, and equivalent cable length measurement.
  • Video Analysis FunctionFor various video signals; quality of experience (QoE) measurement of video signals, such as detection of freeze errors, black errors, gamut errors, in addition to varieties of displays, including the video signal waveform display, vector display, picture display, 5- BAR display and CIE Chromaticity Diagram, are standard features. Errors detected can be recorded as event logs.
  • Audio Analysis FunctionFor audio signals, the level meter display, Lissajous waveform display, surround display (not supported for 8K), and loudness display are possible for SDI signals with embedded audio and MADI audio signals externally entered. The signals can also be muted, and clip error detection is possible. Errors detected can be recorded as event logs.
  • Eye-Pattern DisplayThe eye-pattern display and jitter display are possible for SDI signals covering from HD-SDI to 12G-SDI. For the measured values, automatic measurement is possible in addition to measurement with a cursor. Furthermore, the histogram can be superimposed on the eye-pattern display for display.
  • Subtitle/Closed Caption Decode Display Function (Not supported for 8K)The decode display is possible of Japanese subtitles superimposed onto SDI signals, CEA-608 or CEA-708 closed captions, teletexts, and OP47 subtitles.
  • Input of External Synchronizing Signal with the Waveform Display FunctionPhase differences and synchronization status of all SDI video signals can be checked graphically against external reference synchronizing signal (black burst, tri-level sync signal).
  • Customizable LayoutVarious video signal waveforms, vector display, and pictures of input video signals can be laid out in any of the required positions in the preferred sizes. Multiple input signals up to four inputs can be displayed simultaneously, and one single input signal can be displayed in multiple windows.
  • SDI Signal Generating FunctionSDI signals covering HD-SDI to 12G-SDI are supported, and 4K video format of Quad Link 3G-SDI and 8K video format of Quad Link 12G-SDI are also supported. Patterns can be output in the form of HD multi-format color bar, 4K multi-format color bar, HDR color bar, etc.
  • Monitor output connectorsThe SDI OUTPUT connector and TMDS OUTPUT connector transmit the instrument’s screen to a full high definition (1920×1080) display for monitoring purposes.
  • Capture FeatureA screen capture feature, which captures the entire display as still-image data, is available. Not only captured data can be displayed on the instrument, but it can also be compared with an input signal or saved to a USB memory device as bitmap data for viewing on a PC.A frame capture feature (4K 2-screen display is not supported; only FRM format is supported for 8K) is also available. Frames, including the blanking interval, can be captured. You can set the frame capture function mode to manual or auto, which captures frames when errors occur.The frame capture data can be viewed and searched through on a PC using a frame capture viewer.
  • Time Code DisplayThe timecodes embedded in SDI signals can be displayed. The timecode can also be used as the timestamp in the event log.
  • External Remote ConnectorA contact terminal can be used to load presets, switch the input signal, and transmit alarms.
  • Ethernet PortThe following features become available when you connect the instrument to a PC: remote control through TELNET, file transfer through FTP, remote control and alarm generation through SNMP, remote control from a Web browser through HTTP, and internal clock synchronization through SNTP. Using the LV7290 REMOTE CONTROLLER (sold separately) allows up to eight LV5900As to be remote controlled.
  • HDRLevel monitoring of HDR signals supporting S-Log3, C-Log and Log-C in addition to HLG and PQ that are specified in ITU-R BT.2100, and the level management at assumed luminance (Nits)on the display wherein OOTF is taken into consideration are possible.
  • Focus Assist FunctionDevelopment of a new focus detection algorithm in which the non-linear super resolution technology is applied to sensitively enable focusing of low-contrast images that had been hardly detected.
  • RS-422/485 ConnectorFor serial communication, you can select the Leader’s standard protocol or TSL protocol. When using the Leader’s standard protocol, you can remotely recall presets, switch the display channel, and display the camera ID, iris, and tally by using serial communication.When using the TSL protocol, you can control the camera ID (LABEL-1) and tally(TALLY-1,TALLY-2) displays.

Rear Panel

Transmission Distance:Max 10,000mWave ength:1310nmCompliant standards:25GBASE-LRConnector:LCSupported options:LV5600-SER06,LV7600-SER06

Dual rack mount adapter for the LV5300(A)/LV5350.Two LV5300(A) / LV5350 can be mounted in an EIA 19-inch rack.Two options of LV5300(A) + LV5350 need separately option compatibility.

The LR 2478 is a dual rack mount adapter used to install Leader’s 1U half-rack size products in a 19-inch EIA standard rack.

It allows two Leader products to be installed side by side.

The LR2732 is a dual rack mount adapter used to install LV7300 rasterizers in a 19-inch EIA standard rack.

It allows two LV7300s to be installed side by side.

SFR-Fit is software for measuring the MTF (Modulation Transfer Function), which indicates the spatial frequency characteristics of a camera. MTF expresses how faithfully the contrast of the subject being imaged can be reproduced, and is the most important measurement item in evaluating camera performance. Until now, the most commonly used methods for measuring MTF were the slanted edge method based on ISO12233 and the sine wave contrast method using a Siemens star chart. SFR-Fit is a completely new MTF measurement method that uses a unique algorithm to handle images with large distortions, which have been difficult to measure in the past, and image processing such as sharpness and compression. It is ideal for evaluating cameras used in fields such as automobiles, surveillance, and medicine.

Features

  • Resistant to noise and image processingOne problem with the slanted edge method, which is generally used to measure MTF, is that the measured values in the high-frequency region are unstable when there is significant image noise. Also, when image processing such as sharpness and compression is applied, the linearity of the MTF calculation, which is the basis of the slanted edge method, is not satisfied, and the validity of the measured value may be lost. SFR-Fit adopts the sinusoidal contrast method and measures the contrast by the least-squares method. With this method, even if the captured image contains noise or harmonic components due to image processing, the fundamental component can be extracted and measured producing stable results that are not affected by noise or image processing.

  • Compatible with fisheye and ultra-wide-angle camerasThe sine wave contrast method was generally measured using a Siemens star chart, but this measurement method was not compatible with images with large distortions such as those obtained with an ultra-wide-angle camera using a fisheye lens. SFR-Fit solves the problem of the sine wave contrast method using the Siemens star chart by analyzing the distortion of the image and then measuring the MTF on the undistorted test pattern. This function enables MTF measurement that is resistant to noise and image processing and also accommodates distortion. In addition, since the process from image distortion analysis to measurement is automatically executed, it contributes to labor saving in inspection work.

  • Free placement of test chartsSFR-Fit uses a display as a test chart to measure the MTF with a test pattern aligned with the camera and test chart positions. The optimum test pattern is generated on a display placed in the desired test location, and accurate MTF is then measured. This allows for simple measurement of the periphery of an ultra-wide-angle camera. *1*1*1 Exact placement has conditions. For details, please refer to the instruction manual.

  • Can measure localized MTF in a region of interest (ROI)Since the test pattern is switched for each spatial frequency, the measurement area (ROI) is miniaturized and partial MTF can be measured. For example, you can arbitrarily set the measurement points such as the center of the image and the image height of 40% or 80%. The measurement area can be easily set by clicking and dragging with a mouse or entering numerical values.

  • Simple system configurationThe equipment required for measurement is only a PC with SFR-Fit installed and a display used as a test chart. After connecting the camera to be inspected and completing the software settings, simply press the start button and the MTF measurement results will be displayed. MTF plot data and MTF values will be saved as a CSV format file. It is also possible to save images and test patterns during measurement.

function

  • Display channel selection functionMeasurement results can be displayed for each luminance and R.G.B channel. It is possible to display all components at the same time as well as independent display for each component.

  • Graph unit selection functionThere are three selectable result units: line pair per millimeter (LP/mm), cycle per pixel (cycle/pixel), and line width per picture height (LW/PH). Line Pairs Per Millimeter indicates the number of black and white line pairs displayed per millimeter. Cycles per pixel is the unit of spatial frequency normalized by the pixel pitch of the image sensor, indicating the number of cycles of the pattern displayed per pixel. For example, if a sine wave pattern is drawn with 10 horizontal pixels, there is 0.1 cycle per pixel, so 0.1 cycle per pixel. Since at least 2 pixels are required to represent one cycle, the highest frequency is 0.5 cycles per pixel. Per Picture Height indicates the number of scans per image height.

  • Selectable Data PointsYou can display the measured values in the graph of the measurement results. Just click anywhere on the graph to display the measured value, so you can easily read the MTF value. In addition, since it is possible to display multiple points at the same time, the measurement value of each point can be checked instantaneously.

  • Bar chart sampling waveform displayIt is possible to display sampling waveforms for each spatial frequency, brightness, and R.G.B channel of the generated bar chart. The horizontal axis of the graph is the sampling point (resolution varies with spatial frequency). The vertical axis is the luminance level after linearization. The sampling waveform display of SFR-Fit corresponds to the edge profile of the slanted edge method, and can be used, for example, to check the influence of image processing, the occurrence of aliasing, and the saturation of luminance.

Introduction Video

Introducing the SFR-Fit(YouTube)

CES2023 Leader Electronics Corporation Exhibit Report

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