Dual rack mount adapter for the LV5300(A)/LV5350.Two LV5300(A) / LV5350 can be mounted in an EIA 19-inch rack.Two options of LV5300(A) + LV5350 need separately option compatibility.
The LC 2190 is a blank panel for the LR 2490 rack mount adapter.
Use it when installing a single Leader measuring instrument in the LR 2490.
SFR-Fit is software for measuring the MTF (Modulation Transfer Function), which indicates the spatial frequency characteristics of a camera. MTF expresses how faithfully the contrast of the subject being imaged can be reproduced, and is the most important measurement item in evaluating camera performance. Until now, the most commonly used methods for measuring MTF were the slanted edge method based on ISO12233 and the sine wave contrast method using a Siemens star chart. SFR-Fit is a completely new MTF measurement method that uses a unique algorithm to handle images with large distortions, which have been difficult to measure in the past, and image processing such as sharpness and compression. It is ideal for evaluating cameras used in fields such as automobiles, surveillance, and medicine.
Resistant to noise and image processingOne problem with the slanted edge method, which is generally used to measure MTF, is that the measured values in the high-frequency region are unstable when there is significant image noise. Also, when image processing such as sharpness and compression is applied, the linearity of the MTF calculation, which is the basis of the slanted edge method, is not satisfied, and the validity of the measured value may be lost. SFR-Fit adopts the sinusoidal contrast method and measures the contrast by the least-squares method. With this method, even if the captured image contains noise or harmonic components due to image processing, the fundamental component can be extracted and measured producing stable results that are not affected by noise or image processing.
Compatible with fisheye and ultra-wide-angle camerasThe sine wave contrast method was generally measured using a Siemens star chart, but this measurement method was not compatible with images with large distortions such as those obtained with an ultra-wide-angle camera using a fisheye lens. SFR-Fit solves the problem of the sine wave contrast method using the Siemens star chart by analyzing the distortion of the image and then measuring the MTF on the undistorted test pattern. This function enables MTF measurement that is resistant to noise and image processing and also accommodates distortion. In addition, since the process from image distortion analysis to measurement is automatically executed, it contributes to labor saving in inspection work.
Free placement of test chartsSFR-Fit uses a display as a test chart to measure the MTF with a test pattern aligned with the camera and test chart positions. The optimum test pattern is generated on a display placed in the desired test location, and accurate MTF is then measured. This allows for simple measurement of the periphery of an ultra-wide-angle camera. *1*1*1 Exact placement has conditions. For details, please refer to the instruction manual.
Can measure localized MTF in a region of interest (ROI)Since the test pattern is switched for each spatial frequency, the measurement area (ROI) is miniaturized and partial MTF can be measured. For example, you can arbitrarily set the measurement points such as the center of the image and the image height of 40% or 80%. The measurement area can be easily set by clicking and dragging with a mouse or entering numerical values.
Simple system configurationThe equipment required for measurement is only a PC with SFR-Fit installed and a display used as a test chart. After connecting the camera to be inspected and completing the software settings, simply press the start button and the MTF measurement results will be displayed. MTF plot data and MTF values will be saved as a CSV format file. It is also possible to save images and test patterns during measurement.
Display channel selection functionMeasurement results can be displayed for each luminance and R.G.B channel. It is possible to display all components at the same time as well as independent display for each component.
Graph unit selection functionThere are three selectable result units: line pair per millimeter (LP/mm), cycle per pixel (cycle/pixel), and line width per picture height (LW/PH). Line Pairs Per Millimeter indicates the number of black and white line pairs displayed per millimeter. Cycles per pixel is the unit of spatial frequency normalized by the pixel pitch of the image sensor, indicating the number of cycles of the pattern displayed per pixel. For example, if a sine wave pattern is drawn with 10 horizontal pixels, there is 0.1 cycle per pixel, so 0.1 cycle per pixel. Since at least 2 pixels are required to represent one cycle, the highest frequency is 0.5 cycles per pixel. Per Picture Height indicates the number of scans per image height.
Selectable Data PointsYou can display the measured values in the graph of the measurement results. Just click anywhere on the graph to display the measured value, so you can easily read the MTF value. In addition, since it is possible to display multiple points at the same time, the measurement value of each point can be checked instantaneously.
Bar chart sampling waveform displayIt is possible to display sampling waveforms for each spatial frequency, brightness, and R.G.B channel of the generated bar chart. The horizontal axis of the graph is the sampling point (resolution varies with spatial frequency). The vertical axis is the luminance level after linearization. The sampling waveform display of SFR-Fit corresponds to the edge profile of the slanted edge method, and can be used, for example, to check the influence of image processing, the occurrence of aliasing, and the saturation of luminance.
LR2561 is a rack mount adapter that allows two LV5600s to be mounted side by sideor an LV5600 and LV5350 or LV5300(A) to be mounted side by side in an EIA 19-inch rack. Please be advised that the LV5350 and LV5300(A) can only be installed on the right side of the LR2561. If you install only one LV5600, LV5350 or LV5300(A) in the LR2561, you can also install an LC2566 blank panel (sold separately) LR2561 supports both short bar and long Bar rack installations using the included bars.
The LR 2478 is a dual rack mount adapter used to install Leader’s 1U half-rack size products in a 19-inch EIA standard rack.
It allows two Leader products to be installed side by side.
The LV5350 WAVEFORM MONITOR is compact without sacrificing performance, supporting SDI signals from SD through 12G rates. The LV5350 is a 3U half-rack, short-depth waveform monitor with a built-in 7-inch touch screen display and a full array of buttons and control knobs.The waveform, vector, picture, and audio displays enable simple yet comprehensive measurements and quality control of the widest range of audio and video formats. The status display allows you to assess errors and system stability with both event logs and long-term charts. Audio embedded in SDI signals can be shown on the level, Lissajous, and status displays.
The LV5350 has a DC power input, which enables it to be used in locations where AC power supplies are not available. Additionally, the LV5350 can be battery-operated by installing a battery mount option, ideal for onset work or any location where power is a challenge. With its combination of touch screen, dedicated buttons and knobs, and user-defined screen layouts the LV5350 allows complex measurement and monitoring tasks to be quickly completed.
Supports various signal inputsIt supports SD-SDI, HD-SDI, 3G-SDI, 6G-SDI, 12G-SDI single link, 4K 3G-SDI dual link.
Excellent operabilityThe LV5350 adopts a 7-inch full HD panel with a touch panel function.
Customizable layoutVarious items such as video signal waveforms, vector waveforms, and pictures of input signals can be laid out in any position with your favorite size.
SDI signal generation functionSDI signal generation function can handle from HD-SDI to 12G-SDI.
HDRThe HDR signal level monitoring and the level management at the assumed luminance (Nits) in a display considering OOTF are possible.
Focus AssistWe developed a new focus detection algorithm based on nonlinear super-resolution technology; accordingly the focus with high sensitivity can be detected even with low-contrast images, which were conventionally difficult to detect.
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